岗位描述
Key job responsibilities
· Define and develop state-of-the-art Design for Test (DFT) architectures for advanced technology nodes
· Define and execute DFT strategies across scan insertion and ATPG, memory BIST, logic BIST, and analog/PHY test considerations, optimizing coverage, quality, and costs within subsystems and across the entire design
· Develop, maintain, and continuously optimize DFT-related flows, ensuring high-quality DFT implementation from RTL through silicon bring-up
· Collaborate closely with cross-functional teams to ensure testability is designed in from architecture all the way through signoff
· Mentor and develop junior engineers through code reviews, DFT methodology training, and technical guidance on scan insertion, ATPG, and BIST practices
PREFERRED QUALIFICATIONS
· M.Sc. or above in Microelectronics, Integrated Circuit Design, Electrical Engineering, or related fields
· 8+ years of hands-on DFT experience
· Experience in creating and implementing chip-level DFT architecture
· Experience with industry-standard DFT tools and practices, including ATPG, JTAG, and MBIST, as well as trade-offs between test quality and test time
· Excellent problem-solving, debug, root-cause analysis, and communication skills
· Experience in building and developing high-quality DFT methodology/flows
· Good exposure to cross-functional areas including RTL & clock design, STA constraints development and analysis for DFT modes
· Practical experience with ATE/silicon debug